Engineering Change Request (ECR) Reports

These Engineering Change Request (ECR) reports cover software and hardware changes that were made to address problems or to add features. Reports are classified as closed (completed), cancelled, or open (being considered or worked on).

Software revisions for RDS Intranet and RDS DOS indicate the software level at which software changes were implemented. Close investigation of them will show that there are work arounds for most of the software issues.

Hardware changes represent the latest manufacturing version for which released upgrade documentation has been generated.


Title Status Product Rev Low Rev High   
ECR # Title Status Product Revision Report
0105201201 Not completely zeroing 10kVM during scrambling event causes intermittent damage CLOSED RDS Intranet 2.00 PDF
0105201201 Not completely zeroing 10kVM during scrambling event causes intermittent damage CLOSED RDS DOS 8.x PDF
1206201101 SCM not checked nor reset during powerdown after scrambling event causes false 120V check error CLOSED RDS Intranet 2.00 PDF
1206201101 SCM not checked nor reset during powerdown after scrambling event causes false 120V check error CLOSED RDS DOS 8.x PDF
1205201101 Unexpected end of wafer in Acquire occurs with multiple systems and short test lists CLOSED RDS Intranet 2.00 PDF
1130201101 Testing slow due to locked database processes CLOSED RDS Intranet 2.00 PDF
1107201101 VoltsHV abort occurs with Vgs @ Ids test even when HV unit not used CLOSED RDS Intranet 2.00 PDF
1107201102 1st test not pre-grounding PAM-16 pins if pins not already grounded CLOSED RDS Intranet 2.00 PDF
1107201102 1st test not pre-grounding PAM-16 pins if pins not already grounded CLOSED RDS DOS 8.x PDF
1026201101 Sweep current test screen shows web page error when VF installed in PS3 CLOSED RDS Intranet 2.00 PDF
1017201101 Drop down lists raise "unspecified error" after windows IE8 security update KB2586448 installed CLOSED RDS Intranet 1.32 PDF
1004201101 Add option to not call test powerdown at end of non-test user function call CLOSED RDS Intranet 1.32 PDF
1005201102 Instrumentation abort occurs in HV calibration if KEPCO.INI does not exist CLOSED RDS DOS 8.x PDF
0928201101 DMM latched up after 10kV HV breakdown test CLOSED RDS Intranet 1.32 PDF
0928201101 DMM latched up after 10kV HV breakdown test CLOSED RDS DOS 8.14 PDF
0927201101 Options for tab delimited columns and number formatting added to CSV reports CLOSED RDS Intranet 1.32 PDF
0916201101 Receive NACK after probing N number of wafer lots CLOSED RDS Intranet 1.32 PDF
0916201101 Receive NACK after probing N number of wafer lots CLOSED RDS DOS 8.14 PDF
0916201102 Debug 50ms delay left in prober I/O library CLOSED RDS Intranet 1.32 PDF
0908201101 Save MS Report to disk CLOSED RDS Intranet 1.32 PDF
0906201101 Current not increased in BEM test, SWEAT sometimes doesn't start CLOSED RDS Intranet 1.32 PDF
0906201101 Current not increased in BEM test, SWEAT sometimes doesn't start CLOSED RDS DOS 8.14 PDF
0902201102 SelfCal not flagging DMM gain current failures CLOSED RDS Intranet 1.32 PDF
0902201102 SelfCal not flagging DMM gain current failures CLOSED RDS DOS 8.14 PDF
0901201105 Cannot always probe 49 pins in CCD array testing CLOSED RDS Intranet 1.32 PDF
0824201101 Force-sense clamping transistors cause voltage errors for low resistance measurements with HISMU CLOSED PN 11508 A PDF
0815201101 Migrate RDS DOS TSK A-PM-90A prober driver to RDS Intranet CLOSED RDS Intranet 1.32 PDF
0725201101 Error reading in Excel file used for SQL Extractions CLOSED RDS Intranet 1.32 PDF
0707201101 Cannot run SCal without performing temperature potentiometer step CLOSED RDS DOS 8.x PDF
0628201101 Target current in Step V Until I test limited to 200mA when measuring with HISMU CLOSED PN 14001 1.32 PDF
0623201101 Modify PAM matrix cards to prevent node 0 welding CLOSED PN 11107 - PDF
0623201101 Modify PAM matrix cards to prevent node 0 welding CLOSED RDS Intranet 1.32 PDF
0623201101 Modify PAM matrix cards to prevent node 0 welding CLOSED RDS DOS 8.14 PDF
0608201101 WLR metal tests can damage DUT when crossing 300mA CLOSED RDS Intranet 1.32 PDF
0608201101 WLR metal tests can damage DUT when crossing 300mA CLOSED RDS DOS 8.14 PDF
0520201104 Vgs at an Ids not handling target currents near range point properly for P-channel devices CLOSED RDS Intranet 1.32 PDF
0520201104 Vgs at an Ids not handling target currents near range point properly for P-channel devices CLOSED RDS DOS 8.14 PDF
0520201105 Add Excel like IF and other math functions to SQL Extractions library CLOSED RDS Intranet 1.32 PDF
0519201101 Solar power SQL extraction doesn't support IV data in 4th quadrant CLOSED RDS Intranet 1.32 PDF
0512201101 Frequency counter checkout routine needs a ground pin CLOSED RDS DOS 8.x PDF
0510201101 Calibration of Kepco based HV option fails due to register scrambling CLOSED RDS DOS 8.x PDF
0505201101 Add option to disable grounding pins between tests CLOSED RDS Intranet 1.32 PDF
0505201101 Add option to disable grounding pins between tests CLOSED RDS DOS 8.14 PDF
0428201101 Server locks up during XML data export CLOSED RDS Intranet 1.32 PDF
0428201102 Add generic CSV scheme to data export CLOSED RDS Intranet 1.32 PDF
0419201101 Missing primary keys for tables needed for replication CLOSED RDS Intranet 1.32 PDF
0412201101 StepV Until I test always checking PS2 limit bit CLOSED RDS DOS 1.32 PDF
0411201101 Intranet application crashes when calling Crystal Report from within Build interactive test results CLOSED RDS Intranet 1.32 PDF
0404201102 Add units to test name option not working in CSV export CLOSED RDS Intranet 1.32 PDF
0331201101 Runtime error 202 occurs during HV testing CLOSED RDS Intranet 1.32 PDF
0331201101 Runtime error 202 occurs during HV testing CLOSED RDS DOS 8.14 PDF
0330201101 Device export loops on report options and fails CLOSED RDS Intranet 1.31 PDF
0304201101 Exports using Test, Die scheme not handling die patterns with multiple intradie patterns correctly CLOSED RDS Intranet 1.32 PDF
0210201101 Add support of 10kVM CLOSED PN 11508 - PDF
0210201101 Add support of 10kVM CLOSED RDS Intranet 2.00 PDF
0210201101 Add support of 10kVM CLOSED RDS DOS 8.x PDF
0623201101 PAM twinaxial connectors are becoming obsolete CLOSED PN 11107 - PDF
0623201101 PAM twinaxial connectors are becoming obsolete CLOSED RDS Intranet 1.32 PDF
0623201101 PAM twinaxial connectors are becoming obsolete CLOSED RDS DOS 8.14 PDF
0131201101 Device validation fails for intradie patterns with "probe zero" sites CLOSED RDS Intranet 1.31 PDF
1214201001 2kVM fails high voltage ramp during initialization CLOSED RDS Intranet 1.32 PDF
1214201001 2kVM fails high voltage ramp during initialization CLOSED RDS DOS 8.14 PDF
1202201001 Grounding unused pins is not default setting for new tests CLOSED RDS Intranet 1.32 PDF
1122201001 C-V extraction returns error codes for C-V sweep using Vdc sense option CLOSED RDS Intranet 1.32 PDF
1108201005 C-V bias error occurs due to dc current CLOSED RDS Intranet 1.32 PDF
1104201001 Wafer status report shows wrong number of die for all wafers except for first CLOSED RDS Intranet 1.32 PDF
1028201001 DMM-16 with hardware mode switches causes aborts due to register scrambling CLOSED DMM-16 O PDF
1023201001 Fringe capacitance too high for 100kHz CMM repeatability test CLOSED RDS Intranet 2.00 PDF
1023201001 Fringe capacitance too high for 100kHz CMM repeatability test CLOSED RDS DOS 8.x PDF
1023201002 Main Diagnostics does not measure PAM gain resistor on loopback card often enough CLOSED RDS Intranet 2.00 PDF
1023201002 Main Diagnostics does not measure PAM gain resistor on loopback card often enough CLOSED RDS DOS 8.x PDF
1015201001 Driver for Agilent N6700B stops working with 3 units plugged in CLOSED RDS Intranet 1.32 PDF
1015201001 Driver for Agilent N6700B stops working with 3 units plugged in CLOSED RDS DOS 8.14 PDF
1014201001 Add feature to automatically fix linked return result tests OPEN RDS Intranet 2.00 PDF
1009201001 PPG-4 digital test produces false byte 0 failures CLOSED RDS DOS 8.x PDF
1006201003 SCAL prompts could be more clear on DVM test point connections CLOSED RDS DOS 1.32 PDF
1005201001 Post inking a wafer lot does not start in RDS Intranet CLOSED RDS Intranet 1.32 PDF
1003201001 New SCM design CLOSED PN 11106 - PDF
1003201001 New SCM design CLOSED RDS Intranet 2.00 PDF
1003201001 New SCM design CLOSED RDS DOS 2.00 PDF
0922201001 WLR Selfheat (junction spiking, via vioding, contact EM, and mobile ion) aborts with PS3 hot-switching error CLOSED RDS Intranet 1.32 PDF
0922201001 WLR Selfheat (junction spiking, via vioding, contact EM, and mobile ion) aborts with PS3 hot-switching error CLOSED RDS DOS 8.14 PDF
0922201002 No longer pausing after displaying the post summary results in WLR routines CLOSED RDS DOS 8.x PDF
0921201001 Attached equations do not work with SQL extraction tests OPEN RDS Intranet 2.00 PDF
0921201004 Acquire halts testing after first die if last test in test list is SQL extraction test CLOSED RDS Intranet 1.32 PDF
0916201001 Main diagnostics fails CMM capacitance test even though it passes in RDS DOS CLOSED RDS Intranet 1.32 PDF
0910201001 Extraction always using sweep data from first plot in Acquire CLOSED RDS Intranet 1.32 PDF
0910201002 "Domain error" reported during SQL extraction execution CLOSED RDS Intranet 1.32 PDF
0908201001 Install program not publishing MS reports to SQL Server OPEN RDS Intranet 2.00 PDF
0903201001 Matrix plus loopback limits incorrect for 4-T test CLOSED RDS Intranet 2.00 PDF
0903201001 Matrix plus loopback limits incorrect for 4-T test CLOSED RDS DOS 8.13 PDF
0818201002 Acquire randomly stops probing with message "Error in retrieving intradie done status from tester" CLOSED RDS Intranet 1.32 PDF
0813201001 Missing part of serial number in software key report CLOSED RDS Intranet 1.32 PDF
0723201001 2kV tests not running as fast as expected CLOSED RDS Intranet 1.32 PDF
0723201001 2kV tests not running as fast as expected CLOSED RDS DOS 8.14 PDF
0720201001 Add thermocouple, C-V doping, and solar power extraction routines CLOSED RDS Intranet 1.32 PDF
0720201005 Add force I, measure V test using HVSMU CLOSED RDS Intranet 1.32 PDF
0622201001 Added support of simulated test controller for non-Reedholm test system control CLOSED RDS Intranet 2.00 PDF
0622201001 Added support of simulated test controller for non-Reedholm test system control CLOSED RDS DOS 8.13 PDF
0611201001 Add support of 1nF, 10nF, 100nF CMM 100kHz meter CLOSED CMMLC 100k - PDF
0611201001 Add support of 1nF, 10nF, 100nF CMM 100kHz meter CLOSED RDS Intranet 1.32 PDF
0611201001 Add support of 1nF, 10nF, 100nF CMM 100kHz meter CLOSED RDS DOS 8.13 PDF
0611201002 Add support of Solar Diode I-V Sweep CLOSED RDS Intranet 1.32 PDF
0604201001 Performing QuadVSM calibration with DUTs loaded destroys sensitive parts CLOSED RDS DOS 8.13 PDF
0525201001 Obsolete devices do not show up in list views CLOSED RDS Intranet 1.32 PDF
0524201001 PSVzero instrumentation abort occurs when calibrating VF-1A in function backplane CLOSED RDS DOS 8.x PDF
0504201001 CPM connected test has 216 runtime error when using dual station matrix modules CLOSED RDS Intranet 2.00 PDF
0504201001 CPM connected test has 216 runtime error when using dual station matrix modules CLOSED RDS DOS 8.x PDF
0427201001 Second pin label missing from CCD raw report test names with pin-to-pin array tests CLOSED RDS Intranet 1.32 PDF
0331201001 Add support of Cascade 12000 prober CLOSED RDS Intranet 1.32 PDF
0331201001 Add support of Cascade 12000 prober CLOSED RDS DOS 8.14 PDF
0331201002 Matrix plus loopback diag test has wrong node 0 limits CLOSED RDS Intranet 2.00 PDF
0331201002 Matrix plus loopback diag test has wrong node 0 limits CLOSED RDS DOS 8.x PDF
0326201001 Time between data points too large for ultra fast timing sweeps CLOSED RDS Intranet 1.32 PDF
0326201001 Time between data points too large for ultra fast timing sweeps CLOSED RDS DOS 8.14 PDF
0319201001 Bootstrapping SelfCal 10mA gain factor for 1A ranges CLOSED RDS Intranet 1.32 PDF
0319201001 Bootstrapping SelfCal 10mA gain factor for 1A ranges CLOSED RDS DOS 8.14 PDF
0304201001 Instrumentation abort occurs with 200V test if clamp voltage less than 50V CLOSED RDS Intranet 1.32 PDF
0304201001 Instrumentation abort occurs with 200V test if clamp voltage less than 50V CLOSED RDS DOS 8.14 PDF
0304201002 Support zero step delay "step voltage until current" testing CLOSED RDS Intranet 1.32 PDF
0304201002 Support zero step delay "step voltage until current" testing CLOSED RDS DOS 8.14 PDF
0301201001 DMM fails digital test even though nothing wrong with meter CLOSED RDS DOS 8.x PDF
0226201001 Main diagnostics misses leakage failure internal to DMM CLOSED RDS Intranet 1.32 PDF
0226201001 Main diagnostics misses leakage failure internal to DMM CLOSED RDS DOS 8.14 PDF
0219201001 Add drivers for solar test module handler and light sources CLOSED RDS Intranet 1.32 PDF
0219201001 Add drivers for solar test module handler and light sources CLOSED RDS DOS 8.13 PDF
0215201001 Isolation resistor added to SCM voltage output CLOSED SCM F PDF
0214201001 Have current limit error and DMM overrange be valid EOT for step voltage breakdown test types CLOSED RDS Intranet 1.32 PDF
0214201001 Have current limit error and DMM overrange be valid EOT for step voltage breakdown test types CLOSED RDS DOS 8.14 PDF
0211201001 Validating released test in Build also updates last modified date and user CLOSED RDS Intranet 1.32 PDF
0210201001 +12V regulator added to PCL CLOSED PN 11416 H PDF
0210201001 +12V regulator added to PCL CLOSED PN 11500X - PDF
0209201001 +200V breakdown test runs slower when breakdown is less than 100V CLOSED RDS Intranet 2.00 PDF
0209201001 +200V breakdown test runs slower when breakdown is less than 100V CLOSED RDS DOS 8.x PDF
0205201001 Reduction of maximum in-rush current to prevent buffer amplifier latchup CLOSED DMM-16 N PDF
0205201001 Reduction of maximum in-rush current to prevent buffer amplifier latchup CLOSED VFIF-16 F PDF
0204201001 VoltsRampAll and VoltsRamp slower than need to be to prevent overshoot CLOSED RDS Intranet 1.32 PDF
0204201001 VoltsRampAll and VoltsRamp slower than need to be to prevent overshoot CLOSED RDS DOS 8.14 PDF
0204201002 +200V breakdown test not waiting for negative bias PS to 1st reach -100V CLOSED RDS Intranet 1.32 PDF
0204201002 +200V breakdown test not waiting for negative bias PS to 1st reach -100V CLOSED RDS DOS 8.14 PDF
0203201001 Eliminating Voltage Mode Overshoot on 100uA Range CLOSED VFIF-16 F PDF
0202201001 Reduction in sense buffer current after bipolar transistor breakdown CLOSED VFIF AG PDF
0202201001 Reduction in sense buffer current after bipolar transistor breakdown CLOSED VFIF-16 F PDF
0201201001 Errors exporting lot data to CSV file when using UNC path CLOSED RDS Intranet 1.32 PDF
0128201001 Script error in Examine lot report screen CLOSED RDS Intranet 1.32 PDF
0127201001 Reduction in clear line noise sensitivity CLOSED DMM-16 N PDF
0126201001 HVSMU voltage mode response overshoots on 1uA range CLOSED HVSMU H PDF
0108201001 Latest version always copied when creating new version of intradie test list CLOSED RDS Intranet 1.32 PDF
0106201001 Support SQL Server 2008 Native Client ADO provider CLOSED RDS Intranet 1.32 PDF
0105201001 PS voltage range not reset during power down if corrupted during testing CLOSED RDS Intranet 1.32 PDF
0105201001 PS voltage range not reset during power down if corrupted during testing CLOSED RDS DOS 8.14 PDF
0104201001 Format errors exist with Lot Abort report CLOSED RDS Intranet 1.32 PDF
1223200901 RDS Intranet does not provide same realtime feedback for WLR routines as RDS DOS CLOSED RDS Intranet 1.32 PDF
1217200901 Breakdown of bipolar parts can cause register scrambling and VFIF and/or DMM latch-up CLOSED RDS Intranet 2.00 PDF
1217200901 Breakdown of bipolar parts can cause register scrambling and VFIF and/or DMM latch-up CLOSED RDS DOS 8.x PDF
1204200901 Switch to using 1G resistors on loopback in main diagnostics PAM tests and SelfCal PAM calibration CLOSED RDS Intranet 2.00 PDF
1204200901 Switch to using 1G resistors on loopback in main diagnostics PAM tests and SelfCal PAM calibration CLOSED RDS DOS 8.x PDF
1124200901 Improved control during system initialization and power up CLOSED RDS Intranet 2.00 PDF
1124200901 Improved control during system initialization and power up CLOSED RDS DOS 8.x PDF
1106200901 LCR correction factor incorrect and in opposite direction CLOSED RDS DOS 8.x PDF
1103200901 "Type Mismatch" script error message occurs when trying to reboot test controller CLOSED RDS Intranet 1.32 PDF
1103200902 Unable to load records from Excel file using UserLotParams feature CLOSED RDS Intranet 1.32 PDF
1102200902 Second intradie pattern in a die pattern starts on wrong intradie step CLOSED RDS Intranet 1.32 PDF
1031200901 PAM SelfCal limits too tight for 100pA & 1nA ranges CLOSED RDS Intranet 2.00 PDF
1031200901 PAM SelfCal limits too tight for 100pA & 1nA ranges CLOSED RDS DOS 8.x PDF
1030200901 Instrumentation abort occurs with maintenance pin check tool CLOSED RDS DOS 8.x PDF
1030200902 Excess input bias current after 2kV upgrade CLOSED DMM-16 M PDF
1023200901 Shorted device causes instrumentation abort in Beta at an Ic test CLOSED RDS Intranet 1.32 PDF
1023200901 Shorted device causes instrumentation abort in Beta at an Ic test CLOSED RDS DOS 8.14 PDF
1019200901 "Website cannot display the page" error appears during custom report upload OPEN RDS Intranet 2.00 PDF
1015200901 CMM 100kHz corrected value too far off from standard CLOSED RDS Intranet 2.00 PDF
1015200901 CMM 100kHz corrected value too far off from standard CLOSED RDS DOS 8.x PDF
1015200902 Equations not always appearing in schematics CLOSED RDS Intranet 1.32 PDF
1014200901 Runtime error occurs creating new die patterns CLOSED RDS Intranet 1.32 PDF
0506200801 Occassionally device validation reports all chip labels are missing CLOSED RDS Intranet 1.32 PDF
1012200902 Base-emitter junction is reverse biased in gummel sweep when measuring in emitter leg CLOSED RDS Intranet 1.32 PDF
1012200905 Have check ends return pinch-off and turn-on currents CLOSED RDS Intranet 1.32 PDF
1012200905 Have check ends return pinch-off and turn-on currents CLOSED RDS DOS 8.14 PDF
1005200901 Device wizard enhanced for separate selection of die and intradie patterns plus process CLOSED RDS Intranet 1.32 PDF
1003200901 1MHz CMM gain factor tolerance too low CLOSED RDS DOS 8.x PDF
1002200902 DMM meter low node 0 path has excess connections CLOSED DMM-16 M PDF
0921200901 SQL native client not being used by RDS Intranet despite being installed on computer OPEN RDS Intranet 2.00 PDF
0914200901 Run time error occurs on insert new test screen if filter string and filter group filter out all tests CLOSED RDS Intranet 1.32 PDF
0908200901 RDS Intranet does not support SQL Server 2008 CLOSED RDS Intranet 1.31 PDF
0901200901 Diagnostics ignoring several prompts in command line file CLOSED RDS DOS 8.12 PDF
0830200901 HVSMU diagnostic and calibration limits are incorrect CLOSED RDS Intranet 1.31 PDF
0830200901 HVSMU diagnostic and calibration limits are incorrect CLOSED RDS DOS 8.12 PDF
0826200901 PS with large offset results in main diagnostics PAM-PPS over range measurement CLOSED RDS Intranet 1.31 PDF
0826200901 PS with large offset results in main diagnostics PAM-PPS over range measurement CLOSED RDS DOS 8.12 PDF
0826200902 Errors during Boonton 1MHz calibration and diagnostics CLOSED RDS DOS 8.12 PDF
0825200901 Main diagnostics relay tests not grounding unused nodes CLOSED RDS Intranet 1.31 PDF
0825200901 Main diagnostics relay tests not grounding unused nodes CLOSED RDS DOS 8.12 PDF
0820200901 Input protection diodes cannot handle clamping current during HV breakdown CLOSED DMM-16 K PDF
0820200901 Input protection diodes cannot handle clamping current during HV breakdown CLOSED VFIF-16 E PDF
0819200901 Errant instrumentation abort occurs in Hookup calling Condev with CMM CLOSED RDS Intranet 1.31 PDF
0806200901 EG 2001 prober driver setting Z-overtravel at start of wafer test instead of lot initialization CLOSED RDS DOS 8.12 PDF
0803200901 Vgs at an Ids intermittently returns invalid results with fail code 25 CLOSED RDS Intranet 1.31 PDF
0803200901 Vgs at an Ids intermittently returns invalid results with fail code 25 CLOSED RDS DOS 8.12 PDF
0714200901 Add support of NexGen prober CLOSED RDS Intranet 1.32 PDF
0714200901 Add support of NexGen prober CLOSED RDS DOS 8.14 PDF
0709200901 Saturated VT always uses largest drain current entered for first test current CLOSED RDS DOS 8.12 PDF
0615200901 DMM zeroes not reporting or handling 0.35% range errors correctly CLOSED RDS Intranet 1.31 PDF
0615200901 DMM zeroes not reporting or handling 0.35% range errors correctly CLOSED RDS DOS 8.12 PDF
0608200901 Need modified DMM-16 for high voltage TDDB testing CLOSED PN 11051 - PDF
0608200901 Need modified DMM-16 for high voltage TDDB testing CLOSED RDS Intranet 1.31 PDF
0608200901 Need modified DMM-16 for high voltage TDDB testing CLOSED RDS DOS 8.12 PDF
0605200901 RDS Intranet does not support Internet Explorer 8.0 CLOSED RDS Intranet 1.31 PDF
0521200901 Add low disk space checking at the start of each lot in Acquire OPEN RDS Intranet 2.00 PDF
0520200901 Switching units in Intradie Pattern editor makes the application unstable OPEN RDS Intranet 2.00 PDF
0520200903 Cannot measure Beta at an Ic with HISMU CLOSED RDS Intranet 1.31 PDF
0519200901 Calibration routine for VSM-1A and VSM-100mA tried to calibrate Quad VSM CLOSED RDS DOS 8.12 PDF
0508200901 EMREL acts strange and crashes when three or more experiments are started CLOSED RDS DOS 8.12 PDF
0505200901 Not having current limits set for all PS's before first supply is biased damages some CCD devices CLOSED RDS Intranet 1.31 PDF
0421200901 Too large of current range for PS2 in Beta at an Ic causes errant test result CLOSED RDS Intranet 1.31 PDF
0421200901 Too large of current range for PS2 in Beta at an Ic causes errant test result CLOSED RDS DOS 8.12 PDF
0420200901 Capacitance test aborts with dc bias error with 4280A CLOSED RDS Intranet 1.31 PDF
0420200901 Capacitance test aborts with dc bias error with 4280A CLOSED RDS DOS 8.12 PDF
0420200902 Capacitance bias always reset to 0V when editing test in EMPAC CLOSED RDS DOS 8.12 PDF
0415200901 Cannot run I@V or I@T sweeps on parts in load boards on RI-51 CLOSED RDS DOS 8.12 PDF
0331200901 Acquire halts lot after testing first intradie when intradie pattern has two or more intradie CLOSED RDS Intranet 1.31 PDF
0331200902 Clicking Move On button in intradie pattern editor results in VBscript error CLOSED RDS Intranet 1.31 PDF
0331200903 Deleting last intradie in manual mode clears all assigned intradie test lists CLOSED RDS Intranet 1.31 PDF
0326200901 Crystal Reports XI product discontinued CLOSED RDS Intranet 1.31 PDF
0311200901 SQL native client provider not selected after installed CLOSED RDS Intranet 1.31 PDF
0310200901 Database error occurs when creating a new die pattern or applying new die sizes to existing pattern CLOSED RDS Intranet 1.30.09 PDF
1210200802 Test engine crashes with "216" error if first wafer of lot fails auto aligment and Acquire halted CLOSED RDS Intranet 1.31 PDF
0226200901 High voltage tests result in 216 general protection crash when using pin table CLOSED RDS Intranet 1.31 PDF
0226200901 High voltage tests result in 216 general protection crash when using pin table CLOSED RDS DOS 8.12 PDF
0217200901 Status and updating of index statistics missing from DB maintenance tool CLOSED RDS Intranet 1.31 PDF
0210200901 Acquire locks during probing showing: "Timeout while waiting for receive" CLOSED RDS Intranet 1.31 PDF
0130200901 Collector voltage for first step used in both steps in Beta at an Ie and Ic tests CLOSED RDS DOS 8.12 PDF
0130200902 Limit bit for PS2 not being checked for bipolar and FET tests CLOSED RDS DOS 8.12 PDF
0130200903 Selecting to fix range the meter in Beta at an Ic or Ie causes instrumentation abort CLOSED RDS DOS 8.12 PDF
0129200901 Exporting CSV records is extremely slow CLOSED RDS Intranet 1.31 PDF
0112200901 Cannot use 2kVM on drain or collector with standard FET and bipolar test types CLOSED RDS Intranet 1.31 PDF
1222200801 Want report for only one selected process on process library screen CLOSED RDS Intranet 1.31 PDF
1222200802 Timeout error running database maintenance scripts CLOSED RDS Intranet 1.31 PDF
1209200801 Uncorrected starting Vgs used in linear portion of PMS test when measuring in drain CLOSED RDS Intranet 1.31 PDF
1209200801 Uncorrected starting Vgs used in linear portion of PMS test when measuring in drain CLOSED RDS DOS 8.12 PDF
1203200801 Cint overflow error at line 2193 when selecting user loaded lot information CLOSED RDS Intranet 1.31 PDF
1201200801 Gm, VT at % Ids uses percentage value for bias check instead of Vgs start CLOSED RDS Intranet 1.31 PDF
1026200504 Cannot extract sweep data inside test equations CLOSED RDS Intranet 1.32 PDF
1125200801 Diagnostic test for node leakage does not detect leakage to ground CLOSED RDS Intranet 1.31 PDF
1125200801 Diagnostic test for node leakage does not detect leakage to ground CLOSED RDS DOS 8.12 PDF
1125200802 Main diagnostics hangs when starting CLOSED RDS Intranet 1.31 PDF
1119200801 Low pin for 2T resistance test not connected when using HISMU CLOSED RDS DOS 8.12 PDF
1119200802 I @ V test aborts trying to check I limit on disconnected PS#1 when using HISMU CLOSED RDS DOS 8.12 PDF
1119200803 Low pin not connected during test when using PAM CLOSED RDS Intranet 1.31 PDF
1117200801 Return results not working for Early Effect and SS Beta tests CLOSED RDS Intranet 1.31 PDF
1114200801 Cannot use HISMU auxiliary pins and 2kV on chuck in one probe pass CLOSED PN 11507 - PDF
1114200801 Cannot use HISMU auxiliary pins and 2kV on chuck in one probe pass CLOSED RDS Intranet 1.30.03 PDF
1114200801 Cannot use HISMU auxiliary pins and 2kV on chuck in one probe pass CLOSED RDS DOS 8.12 PDF
1114200802 Supplies not connected to node not powered down at end of a test CLOSED RDS Intranet 1.31 PDF
1114200802 Supplies not connected to node not powered down at end of a test CLOSED RDS DOS 8.12 PDF
1114200803 Zeroing HISMU in test power down causes false instrumentation scrambled abort CLOSED RDS Intranet 1.31 PDF
1114200803 Zeroing HISMU in test power down causes false instrumentation scrambled abort CLOSED RDS DOS 8.12 PDF
1114200804 Integrated thermal chuck returns 1M as temperature with EG 2001 CLOSED RDS Intranet 1.31 PDF
1110200801 FET tests do not support measuring in drain with HISMU CLOSED RDS Intranet 1.31 PDF
1110200802 Cannot select using PAM with most single point tests CLOSED RDS Intranet 1.31 PDF
1110200803 Die size when probing in microns not converted correctly in FMT data file CLOSED RDS DOS 1.32 PDF
1105200801 HISMU pulse duty cycle not controlled at driver level CLOSED RDS Intranet 1.31 PDF
1105200801 HISMU pulse duty cycle not controlled at driver level CLOSED RDS DOS 8.12 PDF
1020200801 Bipolar tests do not support measuring in collector or using HISMU CLOSED RDS Intranet 1.31 PDF
1009200801 Power up control added to 2kV module OPEN 2kVM B PDF
1008200801 Disable automatic 120V enable at power up CLOSED PN 11500 F PDF
1006200801 Checkboxes missing from intradie list view on device wizard screen CLOSED RDS Intranet 1.31 PDF
0918200801 Step BV test always reaches clamp voltage CLOSED RDS Intranet 1.31 PDF
0918200801 Step BV test always reaches clamp voltage CLOSED RDS DOS 8.12 PDF
0916200801 Acquire ground pins, edge sense, and continuity test features not dealing with pins grounded correctly CLOSED RDS Intranet 1.31 PDF
0916200801 Acquire ground pins, edge sense, and continuity test features not dealing with pins grounded correctly CLOSED RDS DOS 8.12 PDF
0915200802 Resistance tests with force-sense generate error 303 when downloaded to test controller CLOSED RDS Intranet 1.31 PDF
0912200802 Add support of 500V stress (QuadVSM) to reliability test systems CLOSED QuadVSM - PDF
0912200802 Add support of 500V stress (QuadVSM) to reliability test systems CLOSED RDS DOS 8.12 PDF
0903200801 4T force-sense test leaves DMM in fix range mode CLOSED RDS Intranet 1.30.01 PDF
0903200802 Intermittent PS fixrange abort errors occur with values like 5.0075 and 10.0093 during testing CLOSED RDS Intranet 1.30.01 PDF
0903200802 Intermittent PS fixrange abort errors occur with values like 5.0075 and 10.0093 during testing CLOSED RDS DOS 8.12 PDF
0903200803 Large RDS DOS GEM files imported independent of Device import cause run time error CLOSED RDS Intranet 1.30.01 PDF
0201200601 207 runtime error occurs when running with SelfCal on but no SelfCal.ini file present CLOSED RDS DOS 8.12 PDF
0828200803 Overrange abort error in step BV test in Build CLOSED RDS Intranet 1.30.01 PDF
0828200804 Tested lots not appearing in list views on any screens CLOSED RDS Intranet 1.30.01 PDF
0828200805 Script error "type mismatch 'DevNumMid' appears when getting instrumentation status CLOSED RDS Intranet 1.30.01 PDF
0828200806 Install does not import custom export fields from XML to database CLOSED RDS Intranet 1.30.01 PDF
0828200808 Cannot rename serial number of an existing probe card CLOSED RDS Intranet 1.31 PDF
0827200801 Acquire crashes with error "type mismatch, line 240" when trying to start lot on EG 4090 CLOSED RDS Intranet 1.30.01 PDF
0825200801 Cannot set Crystal Report version being used to 9.0 CLOSED RDS Intranet 1.30.01 PDF
0825200802 SQL database status tools timeout when getting index and fragmentation information CLOSED RDS Intranet 1.30.01 PDF
0825200803 User is warned about drive C being low on space even though database is on drive D CLOSED RDS Intranet 1.30.01 PDF
0822200801 Test code not powering down when abort occurs resulting in aborts for all subsequent tests CLOSED RDS Intranet 1.30.01 PDF
0822200801 Test code not powering down when abort occurs resulting in aborts for all subsequent tests CLOSED RDS DOS 8.12 PDF
0822200802 PS1 not set to 100mA range, 20mA value during capacitance offset in EMAGE/Sweeps CLOSED RDS Intranet 1.30.01 PDF
0822200802 PS1 not set to 100mA range, 20mA value during capacitance offset in EMAGE/Sweeps CLOSED RDS DOS 8.12 PDF
0821200801 SelfCal for HISMU causes failures of properly built modules CLOSED RDS Intranet 1.30.01 PDF
0821200801 SelfCal for HISMU causes failures of properly built modules CLOSED RDS DOS 8.12 PDF
0818200801 Negative 4-T resistance returned instead of force-sense error CLOSED RDS Intranet 1.30.01 PDF
0803200801 Main diagnostic DMM current limit test fails on high pin count systems CLOSED RDS Intranet 1.30 PDF
0803200801 Main diagnostic DMM current limit test fails on high pin count systems CLOSED RDS DOS 8.11 PDF
0728200801 Several screens (Probe Setup, Pass-Fail Setup) either load slowly or do not load at all CLOSED RDS Intranet 1.30 PDF
0723200801 Instrumentation abort when trying to test capacitance without bias CLOSED RDS Intranet 1.30 PDF
0723200801 Instrumentation abort when trying to test capacitance without bias CLOSED RDS DOS 8.11 PDF
0623200801 Wafer data being automatically deleted by mistake CLOSED RDS Intranet 1.31 PDF
0618200801 UFM Test not as exhaustive as should be CLOSED RDS DOS 8.11 PDF
0601200801 Support for HP LCR 4284A not working in latest versions CLOSED RDS Intranet 1.30.01 PDF
0601200801 Support for HP LCR 4284A not working in latest versions CLOSED RDS DOS 8.11 PDF
0529200801 High node 0 relay being closed during Kepco HV unit connection CLOSED RDS Intranet 1.30 PDF
0529200801 High node 0 relay being closed during Kepco HV unit connection CLOSED RDS DOS 8.11 PDF
0527200801 Main Diagnostic matrix + loopback limits overcompensate for PAM-12 CLOSED RDS Intranet 1.30 PDF
0527200801 Main Diagnostic matrix + loopback limits overcompensate for PAM-12 CLOSED RDS DOS 8.11 PDF
0516200801 Cannot execute SQL Stored Procedure to populate UserLotParams table CLOSED RDS Intranet 1.30 PDF
0516200802 Tiny wafer maps displayed in Examine CLOSED RDS Intranet 1.30 PDF
0512200801 PAM Diagnostic box not grounded for PPS/PAM tests CLOSED PN 11603 F PDF
0512200802 Data export option for XML does not exist CLOSED RDS Intranet 1.30 PDF
0508200801 PAM Calibration is too sensitive without averaging CLOSED RDS DOS 8.11 PDF
0506200801 Unchecked use chip check box is disabled once CCD tests are added to test list CLOSED RDS Intranet 1.32 PDF
0505200801 Error with PAM reported as PS1 error in Main Diagnostics CLOSED RDS Intranet 1.30 PDF
0505200801 Error with PAM reported as PS1 error in Main Diagnostics CLOSED RDS DOS 8.11 PDF
0417200801 New process cannot be added to released tests and limits of released tests cannot be edited CLOSED RDS Intranet 1.31 PDF
0410200803 Takes a long time to switch between Build test screens CLOSED RDS Intranet 1.31 PDF
0403200801 Main Diagnostic PAM Current test fails with multiple PAMs & SelfCal fails if loopback card is removed CLOSED RDS Intranet 1.30 PDF
0403200801 Main Diagnostic PAM Current test fails with multiple PAMs & SelfCal fails if loopback card is removed CLOSED RDS DOS 8.11 PDF
0317200801 Main diagnostics doesn't have option to exclude one or more PAM from tests CLOSED RDS Intranet 1.31 PDF
0314200801 Filtering in list views can result in runtime error "Object Required: 'SelectedItem'" CLOSED RDS Intranet 1.30 PDF
0313200801 Replacement needed for obsolete Boonton 72C capacitance meter CLOSED CMM100k - PDF
0313200801 Replacement needed for obsolete Boonton 72C capacitance meter CLOSED RDS Intranet 1.31 PDF
0313200801 Replacement needed for obsolete Boonton 72C capacitance meter CLOSED RDS DOS 8.12 PDF
0305200801 HOOKUP shows incorrect output for DMM-16 & PAM-16, DMM-16 resistors R31 and R47 may be damaged, plus PAM-16 A/D can be damaged during breakdown test CLOSED DMM-16 J PDF
0305200801 HOOKUP shows incorrect output for DMM-16 & PAM-16, DMM-16 resistors R31 and R47 may be damaged, plus PAM-16 A/D can be damaged during breakdown test CLOSED PAM-16 B PDF
0219200801 Current measurement errors at low compliance not caught by diagnostics CLOSED RDS Intranet 1.31 PDF
0219200801 Current measurement errors at low compliance not caught by diagnostics CLOSED RDS DOS 8.12 PDF
0211200801 Wafer map image is upside down and mirrored compared to probed order CLOSED RDS Intranet 1.30 PDF
0211200803 Cannot make 4T measurements with HISMU and standard tests with standard probe card CLOSED RDS Intranet 1.30 PDF
0211200804 Instrumentation abort of trying to set current above fixed range occurs when starting BEM test CLOSED RDS Intranet 1.31 PDF
0211200804 Instrumentation abort of trying to set current above fixed range occurs when starting BEM test CLOSED RDS DOS 8.12 PDF
0207200801 Some breakdown, I@V, and V@I tests report breakdown as invalid test result CLOSED RDS Intranet 1.31 PDF
0207200801 Some breakdown, I@V, and V@I tests report breakdown as invalid test result CLOSED RDS DOS 8.11 PDF
0117200801 Update application to run with SQL Server 2005 and Crystal Reports XI CLOSED RDS Intranet 1.30 PDF
0116200801 Cannot alter order or names of fields in CSV export CLOSED RDS Intranet 1.30 PDF
0114200801 Time of first sync_measure is longer than expected with USB keyboard CLOSED RDS DOS 8.12 PDF
0111200801 Breakdown events can scramble and even damage instrumentation CLOSED RDS Intranet 1.30 PDF
0111200801 Breakdown events can scramble and even damage instrumentation CLOSED RDS DOS 8.11 PDF
0109200801 Running maintenance Sys Check results in instrumentation abort CLOSED RDS Intranet 1.31 PDF
0108200801 "ActiveX DLL for registry access is unavailable" fatal error appears at start of program OPEN RDS Intranet 2.00 PDF
0107200801 Accretech (TSK) UF200 prober reports error at first site on all wafers except for first CLOSED RDS Intranet 1.30 PDF
0903200802 Selfcal corrections can cause instrumentation range abort CLOSED RDS Intranet 1.30.01 PDF
0903200802 Selfcal corrections can cause instrumentation range abort CLOSED RDS DOS 8.12 PDF
0106200801 2kV module output stage control is inadequate and hot switching can weld relays at breakdown CLOSED 2kVM A PDF
1228200701 Some SCMs Cause DMM SelfCal Error on Low Voltage Ranges CLOSED SCM E PDF
1224200701 SelfCal qualification limits need to accommodate quiescent temperature CLOSED RDS Intranet 1.30 PDF
1224200701 SelfCal qualification limits need to accommodate quiescent temperature CLOSED RDS DOS 8.11 PDF
1214200702 Editing equations results in "Unknown Test/Unknown Var" being displayed CLOSED RDS Intranet 1.30 PDF
1213200701 Gradient shoves data to left side of plot TABLED RDS Intranet 1.31 PDF
1212200701 AccreTech (TSK) UF200 prober not supported in RDS Intranet CLOSED RDS Intranet 1.30 PDF
1128200701 Add support of 2kV capacitance measurements CLOSED RDS Intranet 1.31 PDF
1128200701 Add support of 2kV capacitance measurements CLOSED RDS DOS 8.12 PDF
1127200701 Size of signal input list views on CCD test screens are too small CLOSED RDS Intranet 1.30 PDF
1126200701 CMM diagnostics incorrectly handles range-to-range zeroes CLOSED RDS DOS 8.12 PDF
1126200702 CMM interface adjustments need to be confirmed CLOSED RDS DOS 8.12 PDF
1121200701 HVSMU A/D zeroing range is not adequate CLOSED HVSMU G PDF
1120200701 Cannot probe with pre-align angle other than 0, 90, 180, or 270 CLOSED RDS Intranet 1.30 PDF
1120200702 Divide by zero reported when measuring resistance while forcing current CLOSED RDS Intranet 1.30 PDF
1115200701 PS over range instrumentation abort in Vt at PMS test CLOSED RDS Intranet 1.31 PDF
1115200701 PS over range instrumentation abort in Vt at PMS test CLOSED RDS DOS 8.12 PDF
1030200701 TEL P8 prober driver waiting for hex 48 at end-of-cassette when it is not supposed to CLOSED RDS Intranet 1.30 PDF
1030200703 Not displaying activity box when applying processes to test lists CLOSED RDS Intranet 1.31 PDF
1030200704 Not displaying physical X,Y location of intradie on Acquire screen when probing CLOSED RDS Intranet 1.32 PDF
1029200701 WLR routines abort trying to autorange PS that is fix ranged CLOSED RDS Intranet 1.30 PDF
1029200701 WLR routines abort trying to autorange PS that is fix ranged CLOSED RDS DOS 8.x PDF
1029200702 Electromigration routines try and use more than three VFIFs if they are in system CLOSED RDS Intranet 1.30 PDF
1029200702 Electromigration routines try and use more than three VFIFs if they are in system CLOSED RDS DOS 8.x PDF
1025200701 SelfCal needing loopback for PAM conflicts with instruction to disconnect PAC for calibration CLOSED RDS Intranet 1.31 PDF
1025200701 SelfCal needing loopback for PAM conflicts with instruction to disconnect PAC for calibration CLOSED RDS DOS 8.12 PDF
1018200701 Intradie pattern displays all intradie at position 0,0 CLOSED RDS Intranet 1.30 PDF
1012200701 Pin leakage test does not ground unused nodes CLOSED RDS Intranet 1.30 PDF
1012200701 Pin leakage test does not ground unused nodes CLOSED RDS DOS 8.11 PDF
1001200701 Unable to open obsolete items as read-only CLOSED RDS Intranet 1.31 PDF
0924200701 Switching hazard abort occurs after step eight of DMM calibration CLOSED RDS DOS 8.11 PDF
0914200701 Starting temperature ramps at 25ºC sometimes results in Acquire abruptly quitting CLOSED RDS Intranet 1.21 PDF
0906200701 Attempting to add multiple reports at the same time results in only the last report being added CLOSED RDS Intranet 1.30 PDF
0905200701 Unable to select per-wafer report type for report options CLOSED RDS Intranet 1.21.05 PDF
0905200702 Cannot specify one wafer name when running report from Examine OPEN RDS Intranet 2.00 PDF
0830200701 Capacitance offset measurement causes instrumentation abort CLOSED RDS Intranet 1.21.05 PDF
0828200701 Software version not specified in diagnostic logs and reports CLOSED RDS Intranet 1.31 PDF
0828200701 Software version not specified in diagnostic logs and reports CLOSED RDS DOS 8.12 PDF
0823200703 Can edit frozen Chip Definition CLOSED RDS Intranet 1.31 PDF
0823200708 Newly installed version of RDS DOS keeps crashing with 105 runtime error when starting CLOSED RDS DOS 8.12 PDF
0822200701 Gummel plot connects base pin to both PS and DMM in the second curve CLOSED RDS Intranet 1.21.05 PDF
0822200701 Gummel plot connects base pin to both PS and DMM in the second curve CLOSED RDS DOS 8.1 PDF
0820200703 Too much repeated information being sent to activity log CLOSED RDS Intranet 2.00 PDF
0820200704 Cannot sort SelfCal reports by date CLOSED RDS Intranet 1.31 PDF
0820200705 Error importing probe card Excel file CLOSED RDS Intranet 1.30 PDF
0820200708 Cannot select HISMU matrix pins from standard tests CLOSED RDS Intranet 1.31 PDF
1018200701 Odd behavior with intradie pattern editor where intradie start all on top of each other CLOSED RDS Intranet 1.30 PDF
0820200714 Setup switches to Kepco instead of 2kVM after module has been removed and re-inserted CLOSED RDS Intranet 1.31 PDF
0820200714 Setup switches to Kepco instead of 2kVM after module has been removed and re-inserted CLOSED RDS DOS 8.12 PDF
0808200701 Instrumentation abort for invalid VSM range not handled cleanly CLOSED RDS DOS 8.1 PDF
0806200701 Voltage vs. Time sweep does not allow viewing of the voltage ramp CLOSED RDS Intranet 1.21 PDF
0806200701 Voltage vs. Time sweep does not allow viewing of the voltage ramp CLOSED RDS DOS 8.1 PDF
0731200701 Must perform hard reboot on controller to recover from instrumentation abort in Acquire CLOSED RDS Intranet 1.30 PDF
0731200702 Unable to import lot data if intradie names do not already exist in database CLOSED RDS Intranet 1.30 PDF
0725200701 EMPAC and EMAGE not correctly connecting pins tied high when measuring in the drain CLOSED RDS DOS 8.1 PDF
0718200701 Cannot force <10nA versus time to measure system capacitance CLOSED RDS Intranet 1.31 PDF
0717200702 Only half of selected signals are moved to bias list view CLOSED RDS Intranet 1.32 PDF
0123200519 Build schematics don't exist for CCD test types CLOSED RDS Intranet 1.31 PDF
0717200706 Process and device pull down lists are not sorted in lot report screen CLOSED RDS Intranet 1.31 PDF
0716200702 Subsequent testing of CCD array tests in Build are slow CLOSED RDS Intranet 1.31 PDF
0716200703 Wafer disposition not ignoring disposition field set to 0% CLOSED RDS Intranet 1.32 PDF
0612200701 Can only enter whole number move distances in intradie pattern editor CLOSED RDS Intranet 1.31 PDF
0530200701 OCX object used to display wafer maps takes too long to load CLOSED RDS Intranet 1.31 PDF
0530200704 Ids - Sweep Vgs, Step Vds test is not storing correct data when using HISMU CLOSED RDS Intranet 1.31 PDF
0530200705 Die pattern editor include feature not using any distance value except zero CLOSED RDS Intranet 1.21.05 PDF
0514200701 HISMU calibration does not adjust for offset on low side CLOSED RDS DOS 8.1 PDF
0514200702 HISMU can be damaged if external voltage applied to HISMU sense lines CLOSED HISMU C PDF
0514200703 Sweep stops taking data if PS goes into current limit CLOSED RDS Intranet 1.21 PDF
0513200702 Labels for sweep tests Measure Ids, Sweep Vgs, Step Vbs and Step Vds are reversed CLOSED RDS Intranet 1.31 PDF
0513200705 Incorrect voltage sent by HISMU with sVolts command when not on 10V range CLOSED RDS Intranet 1.21 PDF
0513200705 Incorrect voltage sent by HISMU with sVolts command when not on 10V range CLOSED RDS DOS 8.1 PDF
0509200701 2kV continuous mode w/o divider plot has wrong X-axis CLOSED RDS Intranet 1.21 PDF
0509200701 2kV continuous mode w/o divider plot has wrong X-axis CLOSED RDS DOS 8.1 PDF
0430200703 Failing outer limits causing wafer disposition errors when center limits selected CLOSED RDS Intranet 1.31 PDF
0426200701 PAM-16 A/D locks up due to range changes with high voltage on PAM input CLOSED PAM-16 A PDF
0421200701 PAM diagnostics failures for PAM-16 caused by dielectric absorption CLOSED RDS DOS 8.1 PDF
0417200701 Displayed results don't match commands executed in Hookup CLOSED RDS DOS 8.1 PDF
0417200702 Sweep test will be executed from Acquire regardless of execute test setting CLOSED RDS DOS 8.1 PDF
0417200703 Sweep test "Ic - Sweep Vce, Step Vbe" aborts with large Vbe CLOSED RDS Intranet 1.31 PDF
0417200703 Sweep test "Ic - Sweep Vce, Step Vbe" aborts with large Vbe CLOSED RDS DOS 8.12 PDF
0415200701 Analog Vzero bit needed for VFIF-16 CLOSED VFIF-16 C PDF
0415200701 Analog Vzero bit needed for VFIF-16 CLOSED RDS Intranet 1.21 PDF
0415200701 Analog Vzero bit needed for VFIF-16 CLOSED RDS DOS 8.1 PDF
0402200701 Hookup menu commands incorrect and rarely used CLOSED RDS DOS 8.1 PDF
0402200702 PAM-16 is unduly sensitive to 50/60Hz noise pickup on the lower current ranges CLOSED PAM-16 A PDF
0329200701 Damage to sensitive devices can occur when power supply changes range with bias applied CLOSED RDS Intranet 1.21 PDF
0329200701 Damage to sensitive devices can occur when power supply changes range with bias applied CLOSED RDS DOS 8.1 PDF
0329200702 Voltage overshoot can cause device damage CLOSED RDS Intranet 1.21 PDF
0329200702 Voltage overshoot can cause device damage CLOSED RDS DOS 8.1 PDF
0329200703 Power supplies are powered down in different order during DMM current range change than at end of test CLOSED RDS Intranet 1.21 PDF
0329200703 Power supplies are powered down in different order during DMM current range change than at end of test CLOSED RDS DOS 8.1 PDF
0327200701 Incorrect procedure and/or information displayed during instrumentation abort CLOSED RDS Intranet 1.21 PDF
0327200701 Incorrect procedure and/or information displayed during instrumentation abort CLOSED RDS DOS 8.1 PDF
0322200701 Instruments fail Selfcal for excessive voltage offset and PAM is not part of Selfcal adjustments CLOSED RDS Intranet 1.21 PDF
0322200701 Instruments fail Selfcal for excessive voltage offset and PAM is not part of Selfcal adjustments CLOSED RDS DOS 8.1 PDF
0314200701 HVSMU calibration difficulties caused by zero adjustment limits being too small CLOSED RDS DOS 8.1 PDF
0309200701 CCD amplifier bias test causing device latch-up by not returning to starting current CLOSED RDS Intranet 1.21.05 PDF
0302200701 Change Matrix Tests to Detect Guard Switch Shorts CLOSED RDS Intranet 1.21 PDF
0302200701 Change Matrix Tests to Detect Guard Switch Shorts CLOSED RDS DOS 8.1 PDF
0302200702 Main diagnostics doesn't test PAMs or CMMs CLOSED RDS Intranet 1.21 PDF
0302200702 Main diagnostics doesn't test PAMs or CMMs CLOSED RDS DOS 8.1 PDF
0228200701 Heap overflow occurs when more than 2k tests are downloaded CLOSED RDS Intranet 1.21 PDF
0227200701 Boonton fuse check is time consuming and not needed in Acquire CLOSED RDS Intranet 1.21 PDF
0215200701 Intradie pattern not unlocked after Excel import CLOSED RDS Intranet 1.30 PDF
0215200704 SQL conflict error trying to insert probe card record using User_ID that doesn't exist in target database CLOSED RDS Intranet 1.30 PDF
0215200705 Charge buildup on nodes, pins, and the DMM can cause damage to sensitive devices CLOSED RDS Intranet 1.21 PDF
0215200705 Charge buildup on nodes, pins, and the DMM can cause damage to sensitive devices CLOSED RDS DOS 8.1 PDF
0207200701 Session times out if Acquire "End of Lot" message on screen for more than four hours CLOSED RDS Intranet 1.21 PDF
0201200601 SelfCal switch in Acquire Setup does not turn adjusts on or off CLOSED RDS Intranet 1.31 PDF
0201200601 SelfCal switch in Acquire Setup does not turn adjusts on or off CLOSED RDS DOS 8.12 PDF
0130200701 Import not assigning new Test_IDs inside pass parameter tests CLOSED RDS Intranet 1.21 PDF
0123200701 Missing sweep data when running CCD tests in Acquire, okay in Build CLOSED RDS Intranet 1.21 PDF
0123200702 Power down occurs twice for twenty-four test types CLOSED RDS Intranet 1.21 PDF
0123200702 Power down occurs twice for twenty-four test types CLOSED RDS DOS 8.1 PDF
0122200705 Intradie test list does not display latest applied process CLOSED RDS Intranet 1.31 PDF
0119200701 Step V, Measure I test connects both PS1 and HISMU+ to same point when using HISMU CLOSED RDS DOS 8.1 PDF
0118200701 Test time per die keeps getting longer and longer CLOSED RDS Intranet 1.21 PDF
0105200701 Wrong error message displayed when prober initialization error occurs at start of wafer lot CLOSED RDS Intranet 1.21 PDF
0105200702 Old WLR tests still appear on EMPAC menu CLOSED RDS DOS 8.1 PDF
1130200601 Add support of TSK UF 3000 prober to RDS DOS CLOSED RDS DOS 8.1 PDF
1127200601 Switching devices with CCD tests between wafer lots causes test validation errors in Acquire CLOSED RDS Intranet 1.21 PDF
1122200601 After an instrumentation abort, message incorrectly states to push F4 instead AltF4 CLOSED RDS DOS 8.1 PDF
1122200602 Unable to validate released or frozen records in Build CLOSED RDS Intranet 1.21.04 PDF
1117200601 Cannot export locked records CLOSED RDS Intranet 1.30 PDF
1117200602 Add support of Sun oven to Integrated Thermal Chuck Control for in-house and packaged TCR testing CLOSED RDS Intranet 1.21 PDF
1117200603 Cannot obsolete a chip definition CLOSED RDS Intranet 1.21 PDF
1116200602 Editing new version of CCD test alters signals of previous version CLOSED RDS Intranet 1.21 PDF
1116200603 Incorrect data displayed with released devices CLOSED RDS Intranet 1.21 PDF
1116200605 Some test results missing from wafer lot when Acquire is resumed CLOSED RDS Intranet 1.32 PDF
1116200609 UserLotEnd not executed when Acquire testing halted CLOSED RDS Intranet 1.21 PDF
1116200609 UserLotEnd not executed when Acquire testing halted CLOSED RDS DOS 8.1 PDF
1115200601 Timeout and/or Nack error occurs when testing overnight CLOSED RDS Intranet 1.30 PDF
0731200702 Import errors with lot data related to Chip_ID and Process_ID CLOSED RDS Intranet 1.30 PDF
0926200601 Time stored for tests run in Acquire is incorrect CLOSED RDS Intranet 1.21 PDF
0925200602 Support added for 2000V HV module CLOSED RDS Intranet 1.21 PDF
0925200602 Support added for 2000V HV module CLOSED RDS DOS 8.1 PDF
0918200601 Unable to obsolete released items CLOSED RDS Intranet 1.31 PDF
0918200603 Runtime error 216 occurs in test engine when CCD pin-to-pin array test uses more than 49 pins CLOSED RDS Intranet 1.21 PDF
0914200601 Use In Report must be set true for test to be used in wafer pass-fail determination CLOSED RDS Intranet 1.21 PDF
0914200602 Memory map check abort occurs when executing any tests with PAM-16s in system CLOSED RDS Intranet 1.21 PDF
0907200601 Clamp needed for negative voltage at PPG output CLOSED PPG G PDF
0907200601 Clamp needed for negative voltage at PPG output CLOSED RDS Intranet 1.31 PDF
0907200601 Clamp needed for negative voltage at PPG output CLOSED RDS DOS 8.12 PDF
1026200518 Runtime error "SelectedItem object is nothing" occurs when insert test is clicked and no item in list view has been selected CLOSED RDS Intranet 1.21 PDF
0828200601 Instrument display does not identify new modules consistently CLOSED RDS Intranet 1.21 PDF
0828200601 Instrument display does not identify new modules consistently CLOSED RDS DOS 8.1 PDF
0825200601 Unable to import record with different released version than one in target database CLOSED RDS Intranet 1.21 PDF
0825200602 Acquire randomly stops moving in the middle of a wafer when using HP 6633A PS CLOSED RDS Intranet 1.21 PDF
0818200602 Unable to delete scrap wafer data from lot data OPEN RDS Intranet 2.00 PDF
0815200601 Unable to invoke maintenance tools from the DOS command line with CIC cable or power removed CLOSED RDS Intranet 1.21 PDF
0815200601 Unable to invoke maintenance tools from the DOS command line with CIC cable or power removed CLOSED RDS DOS 8.05 PDF
0815200602 Invalid equation test names result in DB import freezing CLOSED RDS Intranet 1.20.04 PDF
0814200601 Automatic calibration of PAM-16 is sometimes skipped at power up CLOSED RDS Intranet 1.21 PDF
0814200601 Automatic calibration of PAM-16 is sometimes skipped at power up CLOSED RDS DOS 8.1 PDF
0810200602 Target value not displayed on lot summary or raw reports CLOSED RDS Intranet 1.21 PDF
0809200601 Copying a chip definition that has not been edited results in a runtime error CLOSED RDS Intranet 1.21 PDF
1117200603 Clicking the obsolete or restore buttons on the chip definition screen results in a runtime error CLOSED RDS Intranet 1.31 PDF
0806200601 Zener Characteristics Affect PPG Pulse Shape CLOSED PPG F PDF
0726200601 Unable to delete released tests or CCD tests with multiple versions CLOSED RDS Intranet 1.32 PDF
0329200701 DUT damaged after testing because of inadequate delay between power off and grounding all nodes & pins CLOSED RDS Intranet 1.21 PDF
0329200701 DUT damaged after testing because of inadequate delay between power off and grounding all nodes & pins CLOSED RDS DOS 8.1 PDF
0721200601 Error "cannot find ID for field Step_ID in target DB" occurs during import CLOSED RDS Intranet 1.30 PDF
0721200602 Export/Import activity screen always stays on top preventing other applications from being accessible CLOSED RDS Intranet 1.21 PDF
0721200604 Check boxes on list views used to select default items not working on DOS device import CLOSED RDS Intranet 1.30 PDF
0720200601 Expand options for significant digits in lot reports CLOSED RDS Intranet 1.21 PDF
0720200602 Overflow error occurs during Examine trend reduction if no lots or trend test groups exist CLOSED RDS Intranet 1.21 PDF
0714200601 Language cannot be deleted CLOSED RDS Intranet 1.31 PDF
0711200601 Released versions not shown on master test list view CLOSED RDS Intranet 1.20.03 PDF
0707200601 VRamp and Jramp WLR tests show incorrect results CLOSED RDS Intranet 1.20.04 PDF
0707200601 VRamp and Jramp WLR tests show incorrect results CLOSED RDS DOS 8.05 PDF
0706200601 Runtime error occurs when exporting more than 65K records CLOSED RDS Intranet 1.20.03 PDF
0706200602 Node leakage failures in main diagnostics can be missed if PS1 in current limit CLOSED RDS Intranet 1.21 PDF
0706200602 Node leakage failures in main diagnostics can be missed if PS1 in current limit CLOSED RDS DOS 8.05 PDF
0820200705 CardSerNum_ID not being handled correctly when importing lot data CLOSED RDS Intranet 1.30 PDF
0629200601 Scrollbars missing from Acquire view probe and view PF setup windows CLOSED RDS Intranet 1.21 PDF
0629200602 Goto end of test list ID 9999 & linked test ID 0 not imported CLOSED RDS Intranet 1.20.03 PDF
0629200603 Chip Definition tables exported even if Use Chip not checked CLOSED RDS Intranet 1.20.03 PDF
0629200604 Clear all button on intradie test list editor not clearing all set tests CLOSED RDS Intranet 1.30 PDF
0629200605 OneToOne pin table overwritten during import CLOSED RDS Intranet 1.30 PDF
0628200601 Clicking on help menu in Examine trend viewer results in a runtime error CLOSED RDS Intranet 1.21 PDF
0627200601 Prior date used if previous lot first selected when testing new lot in Acquire CLOSED RDS Intranet 1.31 PDF
0627200604 Runtime error 216 occurs when printing FMT file with missing wafer IDs CLOSED RDS DOS 8.1 PDF
0627200605 Not showing enough tests in intradie test list editor CLOSED RDS Intranet 1.21 PDF
0627200608 Must click Continue after each intradie in Acquire even though results mode is set to 'None' or 'Show' CLOSED RDS Intranet 1.21 PDF
0627200609 "Page cannot be displayed" appears accessing Wafer Maps, Filters, Plots, Trends, Lists & Reports CLOSED RDS Intranet 1.20.03 PDF
0627200610 Runtime exception error occurs after validating a device with no probe setup selected CLOSED RDS Intranet 1.21 PDF
0626200601 Matrix pins reported open in main diagnostics after testing but okay after system is reset CLOSED RDS Intranet 1.30.01 PDF
0625200601 Cannot edit new version of CCD test CLOSED RDS Intranet 1.20.03 PDF
0619200601 Step V Until I does not work through 0A CLOSED RDS Intranet 1.21 PDF
0619200601 Step V Until I does not work through 0A CLOSED RDS DOS 8.1 PDF
0506200601 Calibration code for +1500V option allows possible hot switching CLOSED RDS DOS 8.05 PDF
0425200601 Error message "Invalid parameters received with command 9" appears when executing inserted test CLOSED RDS Intranet 1.20.03 PDF
0424200601 Last CCD pin not being powered down the same when using pre-charge node feature CLOSED RDS Intranet 1.20.03 PDF
0422200601 DMM-12 fails Selfcal for offset on 1uA range CLOSED RDS Intranet 1.21 PDF
0422200601 DMM-12 fails Selfcal for offset on 1uA range CLOSED RDS DOS 8.05 PDF
0421200601 Copied chip definition does not copy final signal labels CLOSED RDS Intranet 1.21 PDF
0421200602 Error message is displayed that edited wafer list wasn't saved even when it was CLOSED RDS Intranet 1.20.03 PDF
1117200801 Cannot insert existing Return Result test CLOSED RDS Intranet 1.31 PDF
0409200601 Q10 of HVSMU (P/N 11035) fails early CLOSED HVSMU F PDF
0404200601 IE forces activating each ActiveX control: "Click to activate and use this control" is shown CLOSED RDS Intranet 1.20.03 PDF
0330200603 DMM fails Selfcal for current calibration CLOSED SCM C PDF
0330200603 DMM fails Selfcal for current calibration CLOSED RDS Intranet 1.21 PDF
0330200603 DMM fails Selfcal for current calibration CLOSED RDS DOS 8.05 PDF
0330200604 PAMs Fail PAM Module Test When Testing All PAMs Simultaneously CLOSED RDS DOS 8.05 PDF
0321200601 PS limit error messages (fail codes) do not match instrumentation status. PS status byte always 1. CLOSED RDS Intranet 1.20.02 PDF
0321200602 Low terminal power supply not connected for force current, measure voltage tests CLOSED RDS DOS 8.05 PDF
0321200603 Offsets are different in CMM DIAG than in CMM Calibraton CLOSED RDS DOS 8.05 PDF
0321200604 Instrumentation abort occurs with HISMU module test CLOSED RDS DOS 8.05 PDF
0314200601 Max leakage and target current reversed in 1500V tests CLOSED RDS Intranet 1.20.02 PDF
0303200601 Wrong Resistor Type Installed on PPG CLOSED PPG E PDF
0301200601 Years are ignored when sorting intradie test list by last used column CLOSED RDS Intranet 1.21 PDF
0227200601 Whether using customer or manufacturing error limits when running SelfCal is unclear CLOSED RDS Intranet 1.21 PDF
0227200601 Whether using customer or manufacturing error limits when running SelfCal is unclear CLOSED RDS DOS 8.05 PDF
0225200601 Jumper selection for HISMU current gain calibration is confusing CLOSED RDS DOS 8.1 PDF
0224200601 SMU_Test does not work as described CLOSED RDS DOS 8.05 PDF
0223200601 Jramp halts after starting with result category three CLOSED RDS Intranet 1.21 PDF
0223200601 Jramp halts after starting with result category three CLOSED RDS DOS 8.1 PDF
1214200702 When editing attached equation, test name of current test does not always appear CLOSED RDS Intranet 1.30 PDF
0223200604 RDS Intranet install error "Violation of PRIMARY KEY constraint 'PK_Tester_Names'" CLOSED RDS Intranet 1.31 PDF
0222200602 File extensions not automatically added when saving graphics files in Examine CLOSED RDS Intranet 1.20.03 PDF
0222200605 Jramp crashes to DOS with use voltage greater than zero CLOSED RDS Intranet 1.12 PDF
0222200606 Cannot export to Excel files with spaces in the filenames CLOSED RDS Intranet 1.20.03 PDF
0222200607 Lot data taken using Acquire's resume feature has data missing from CSV export file CLOSED RDS Intranet 1.20.03 PDF
0222200610 Runtime error "Variable is undefined: Chip_Names" while editing intradie pattern in manual mode CLOSED RDS Intranet 1.20.02 PDF
0222200611 Vgs used for slope Ids measurements for Vt or Gm @ Ids is wrong polarity for P-channel devices CLOSED RDS Intranet 1.20.02 PDF
0222200612 High Voltage (+1500V) tests produce bogus results when DMM enters overrange condition CLOSED RDS Intranet 1.20.02 PDF
0222200612 High Voltage (+1500V) tests produce bogus results when DMM enters overrange condition CLOSED RDS DOS 8.05 PDF
0222200613 2T resistance test with low bias option selected returns measured voltage instead of resistance CLOSED RDS Intranet 1.20.02 PDF
0221200601 HVSMU output current inadequate due to R69 CLOSED HVSMU D PDF
0220200601 Wrong Resistor Identified for HVSMU Calibration CLOSED RDS DOS 8.1 PDF
0213200601 Cannot run tests after changing chip definitions CLOSED RDS Intranet 1.21 PDF
0213200602 Tested lots not shown in lot data list view when filtered by week or month CLOSED RDS Intranet 1.21 PDF
0213200603 Last Digit is Sometimes Truncated on Raw Data Report CLOSED RDS Intranet 1.21 PDF
0212200601 Skipped test causes die failure in wafer pass-fail report even if dispositioning set to zero CLOSED RDS Intranet 1.20.02 PDF
0202200601 Raw data report for package part testing does not exist CLOSED RDS Intranet 1.21 PDF
0201200601 Build probe setup options do not include turning on/off CMM corrections CLOSED RDS Intranet 1.31 PDF
0201200601 Build probe setup options do not include turning on/off CMM corrections CLOSED RDS DOS 8.12 PDF
0201200602 DMM zero adjusments made to ADC readings in instrumentation status CLOSED RDS Intranet 1.2 PDF
0201200602 DMM zero adjusments made to ADC readings in instrumentation status CLOSED RDS DOS 8.04 PDF
0124200601 Runtime error in Build saving Calculate Delta Length test CLOSED RDS Intranet 1.20.03 PDF
0119200601 1500V Continuous test missing breakdown event CLOSED RDS Intranet 1.2 PDF
0119200601 1500V Continuous test missing breakdown event CLOSED RDS DOS 8.04 PDF
0118200601 1500V Messages in Power Up Are Incorrect CLOSED RDS Intranet 1.2 PDF
0118200601 1500V Messages in Power Up Are Incorrect CLOSED RDS DOS 8.04 PDF
0117200601 Add support of Vcharge to CCD OS Test type CLOSED RDS Intranet 1.2 PDF
0117200602 Cannot easily combine different power on signals and move external PS bias location CLOSED RDS Intranet 1.20.01 PDF
0117200603 CCD tests not setting test result status as limit failure if part fails power up CLOSED RDS Intranet 1.2 PDF
0117200607 Paper size field moves on die pattern edit window when screen is re-sized CLOSED RDS Intranet 1.21 PDF
0117200609 Wafer pass-fail by die report incorrectly identifying wafer status CLOSED RDS Intranet 1.20.02 PDF
0117200612 Test names longer than 30 characters can be entered even though they shouldn't be allowed CLOSED RDS Intranet 1.20.03 PDF
0117200613 Device will not validate if process step settings exclude all tests from an intradie test list CLOSED RDS Intranet 1.32 PDF
0117200615 Prefix of device ID not being stripped in custom pick list code CLOSED RDS Intranet 1.20.03 PDF
0117200616 Number of squares in Build limited to 1E+6 CLOSED RDS Intranet 1.2 PDF
0117200617 Acquire resume feature re-starting on incorrect intradie CLOSED RDS Intranet 1.32 PDF
0123200519 Displaying too many schematics in Build causes browser to lockup CLOSED RDS Intranet 1.31 PDF
0117200621 All pins grounded state not obvious enough in RDS DOS CLOSED RDS DOS 8.04 PDF
0112200601 Pin Leakage Instruction Does Not Permit Looping CLOSED RDS Intranet 1.2 PDF
0112200601 Pin Leakage Instruction Does Not Permit Looping CLOSED RDS DOS 8.04 PDF
0110200601 Gate voltage passed to Stress at Vgs test is incorrectly inverted for PMOS transistors CLOSED RDS Intranet 1.20.04 PDF
0110200601 Gate voltage passed to Stress at Vgs test is incorrectly inverted for PMOS transistors CLOSED RDS DOS 8.05 PDF
0106200602 "Variable undefined" error occurs when opening released intradie pattern CLOSED RDS Intranet 1.21 PDF
0104200601 SCM Output Amplifier Oscillation Prevents Stable Operation CLOSED SCM B PDF
0103200601 ActiveX object load error when trying to load UserDataCSV_VB6.DLL example file CLOSED RDS Intranet 1.20.03 PDF
1228200501 Main diagnostic leakage tests ignoring forcing PS in current limit condition CLOSED RDS Intranet 1.2 PDF
1228200501 Main diagnostic leakage tests ignoring forcing PS in current limit condition CLOSED RDS DOS 8.04 PDF
1206200502 Well and ground pins not connected in NVM/PPG-4 test routines CLOSED RDS Intranet 1.2 PDF
1205200501 Page denied access error occurs when trying to save Setup-Options CLOSED RDS Intranet 1.30 PDF
1205200502 Changing CMM type in Setup does not change displayed configuration values CLOSED RDS Intranet 1.30 PDF
1129200501 Runtime error occurs when trying to validate tests in a Build intradie list CLOSED RDS Intranet 1.2 PDF
1128200501 Pins left connected on RI-53 with EMPAC tests while in DC mode CANCELLED RDS DOS 8.04 PDF
1118200501 Power up routine w/ 1500V in system can take up to 12 minutes to run CLOSED RDS Intranet 1.2 PDF
1118200501 Power up routine w/ 1500V in system can take up to 12 minutes to run CLOSED RDS DOS 8.04 PDF
1117200501 Get "Received Nack from Controller" error message when testing in Build CLOSED RDS Intranet 1.32 PDF
1107200501 Intradie move timeout occurs when using remote server CLOSED RDS Intranet 1.32 PDF
1107200502 CMM Calibration and Diagnostics do not support matrix bank pins on RI-5x/70 test systems CLOSED RDS DOS 8.04 PDF
0731200701 Clear Instruments button in Hookup not clearing command error CLOSED RDS Intranet 1.30 PDF
1102200501 Incorporate DOS 8.04 to 8.13 record changes into DOS Import CLOSED RDS Intranet 1.32 PDF
1026200501 RDS Intranet install program not creating new CCD SQL stored procedures CLOSED RDS Intranet 1.2 PDF
1026200504 Cannot easily call user supplied complex math function to operate on prior test data CLOSED RDS Intranet 1.32 PDF
1026200505 Overwriting existing lot data does not overwrite plots taken with CCD tests CLOSED RDS Intranet 1.31 PDF
1026200506 CCD test validation and execution ignore edits made to test signals CLOSED RDS Intranet 1.21 PDF
1026200508 Cannot force test insertion at start or end of test list CLOSED RDS Intranet 1.21 PDF
1026200509 Main diagnostics not running as expected RI-70 system type CLOSED RDS Intranet 1.2 PDF
1026200509 Main diagnostics not running as expected RI-70 system type CLOSED RDS DOS 8.04 PDF
1026200511 Operator interface for package parts does not exist and using manual wafer probing is too clumsy CLOSED RDS Intranet 1.2 PDF
1026200512 Error inserting RIR function on second row of equation CLOSED RDS Intranet 1.30 PDF
1026200513 Chip definition being left locked after testing CLOSED RDS Intranet 1.20.03 PDF
1026200514 Not all CCD test library features delivered with first order CLOSED RDS Intranet 1.21 PDF
1026200515 Expand CCD validation for test screens and chip definition editor CLOSED RDS Intranet 1.21 PDF
1026200516 Devices damaged during TDDB bias because of large voltage step CLOSED RDS DOS 8.12 PDF
1117200801 New version of Return Result test not linked to prior test CLOSED RDS Intranet 1.31 PDF
1026200518 Not returning to same position in list view CLOSED RDS Intranet 1.21 PDF
1026200520 Cannot use PPG and PPG-4 at same time in system CLOSED RDS Intranet 1.2 PDF
1026200520 Cannot use PPG and PPG-4 at same time in system CLOSED RDS DOS 8.04 PDF
1026200521 Maintenance CPM Module test fails digital test in high pin count systems CLOSED RDS DOS 8.04 PDF
1024200501 UserResults set in UFTest_Fields record not being returned CLOSED RDS Intranet 1.31 PDF
1011200501 Main diagnostic node leakage test is not handling banks properly on RI-5x/70 test systems CLOSED RDS Intranet 1.2 PDF
1011200501 Main diagnostic node leakage test is not handling banks properly on RI-5x/70 test systems CLOSED RDS DOS 8.04 PDF
1011200502 Acquire Retry option not working correctly after 120V trip error CLOSED RDS Intranet 1.2 PDF
1011200502 Acquire Retry option not working correctly after 120V trip error CLOSED RDS DOS 8.04 PDF
1005200501 Potential for hot switching during system initialization CLOSED RDS Intranet 1.2 PDF
1005200501 Potential for hot switching during system initialization CLOSED RDS DOS 8.04 PDF
1004200501 RDS Intranet PPG-4 (NVM) tests limited to five or more pulses CLOSED RDS Intranet 1.2 PDF
0929200501 DMM calibration program does not always quit when choice is offered CLOSED RDS DOS 8.04 PDF
0919200501 Ground unused pins takes 1ms per pin on high pin count systems CLOSED RDS Intranet 1.13 PDF
0919200501 Ground unused pins takes 1ms per pin on high pin count systems CLOSED RDS DOS 8.04 PDF
0917200501 Incorrect test time returned, high by 27ms or 54ms CLOSED RDS Intranet 1.13 PDF
0916200501 EMPAC and Build won't start Vgs search test that has large Ids specified due to boundary check failure CLOSED RDS Intranet 1.2 PDF
0916200501 EMPAC and Build won't start Vgs search test that has large Ids specified due to boundary check failure CLOSED RDS DOS 8.04 PDF
0915200501 At start of lot, Acquire sometimes not prompting if auto align set or first wafer loaded CLOSED RDS Intranet 1.13 PDF
0824200501 HVSMU Unable to Output 10mA Consistenly CLOSED HVSMU A PDF
0809200501 New Chip Definitions and Special Test Types for CCD Testing CLOSED RDS Intranet 1.13 PDF
0801200501 Runtime errors occur when handling names with single or double quotes OPEN RDS Intranet 2.00 PDF
0801200502 Orphaned tests edited in master test list no longer displayed as orphans CLOSED RDS Intranet 1.20.03 PDF
0123200519 RT error when drawing WLR TDDB schematic from test list CLOSED RDS Intranet 1.31 PDF
0719200501 Imported Force Voltage - Measure Current test has duplicate low pin CLOSED RDS Intranet 1.12.02 PDF
0719200502 Corrupt wafer list causes probing to run but no data transferred to main database afterwards OPEN RDS Intranet 2.00 PDF
0719200503 Session not killed when X used to close browser instead of logout button CLOSED RDS Intranet 1.12.02 PDF
0719200504 Errors importing some DOS equations with O, R, K, and B functions CLOSED RDS Intranet 1.12.02 PDF
0719200505 Attached equation containing RIR function does not validate CLOSED RDS Intranet 1.12.02 PDF
0719200506 Power Down Between Range Changes not Optional in RDS Intranet CLOSED RDS Intranet 1.2 PDF
0719200507 DOS Import Not Always Setting Starting Meter Range CLOSED RDS Intranet 1.12.02 PDF
0719200508 DOS Import Assumes PAM for Low Current Ranges CLOSED RDS Intranet 1.12.02 PDF
0719200509 DOS Import sets current reversal to true for all 4 terminal resistance and voltage tests CLOSED RDS Intranet 1.12.02 PDF
0719200510 DOS Import of +200V V@I test sets third pin to ground CLOSED RDS Intranet 1.12.02 PDF
0719200511 Operator can reset probe card touchdown counter OPEN RDS Intranet 2.00 PDF
0719200513 Acquire show mode not displaying results long enough CLOSED RDS Intranet 1.32 PDF
0719200514 Cannot print using Crystal Reports without prompts or opening second window OPEN RDS Intranet 2.00 PDF
0719200515 Add support of filtering list views by text CLOSED RDS Intranet 1.31 PDF
0628200501 Error 1053 occurs when trying to start Crystal Report Application Server in Windows with DEP CLOSED RDS Intranet 1.31 PDF
0623200504 Cannot easily create wafer list with wafers in random order in RDS Intranet CLOSED RDS Intranet 1.2 PDF
0623200505 Example reports missing features from RDS DOS, such as only printing failed results CLOSED RDS Intranet 1.21 PDF
0623200507 Probing errors occur in Acquire when using a zero probe intradie in an intradie pattern CLOSED RDS Intranet 1.32 PDF
0623200508 Import of DOS Capacitance test with well tied low does not move well pin and erases low pin CLOSED RDS Intranet 1.12.02 PDF
0623200508 Import of DOS Capacitance test with well tied low does not move well pin and erases low pin CLOSED RDS DOS 8.04 PDF
0623200511 Cannot select order of tests in report CLOSED RDS Intranet 1.21 PDF
0623200514 DOS Import fails for device if intradie pattern has already been imported with another die pattern CLOSED RDS Intranet 1.12.02 PDF
0606200501 Ids @ Vgs Validation Error when measuring in drain with gate tied high or grounded CLOSED RDS DOS 8.04 PDF
0605200501 Not all duplicate test names renamed during DOS import CLOSED RDS Intranet 1.12 PDF
0605200504 Runtime error "Item cannot be found in the collection corresponding.." occurs during NVM test import CLOSED RDS Intranet 1.32 PDF
0523200501 Incorrect pin settings after some WLR tests imported to RDS Intranet CLOSED RDS Intranet 1.12 PDF
0520200501 Checking PS Status Bits Cause Errant Results When PS not Connected to a Node CLOSED RDS Intranet 1.2 PDF
0520200501 Checking PS Status Bits Cause Errant Results When PS not Connected to a Node CLOSED RDS DOS 8.04 PDF
0513200501 Cannot delete custom report CLOSED RDS Intranet 1.21 PDF
0511200501 RI-75 Tester Type Option Not Available CLOSED RDS Intranet 1.2 PDF
0511200501 RI-75 Tester Type Option Not Available CLOSED RDS DOS 8.04 PDF
0511200502 Main Diagnostics DMM/PPS-SMU Current Test Displays Expected Value 3x Correct Value for HVSMU CLOSED RDS Intranet 1.2 PDF
0511200502 Main Diagnostics DMM/PPS-SMU Current Test Displays Expected Value 3x Correct Value for HVSMU CLOSED RDS DOS 8.04 PDF
0427200501 RT error "Type Mismatch" occurs when opening test for editing with incomplete pin table CLOSED RDS Intranet 1.31 PDF
0421200501 Unable to move back to first data point using left arrow key during EMAGE digitization CLOSED RDS DOS 8.04 PDF
0414200501 After manipulation in EMAGE, Acquire generated PRN files cannot be read in CLOSED RDS DOS 8.04 PDF
0412200501 Using ALT-F6 and F6 to copy a device corrupts DEVICE.LIB in Acquire CLOSED RDS DOS 8.04 PDF
0331200502 Embedded user function UserLotEnd not being called at the end of wafer lot CLOSED RDS Intranet 1.12 PDF
0324200501 Projected stress voltage above 100V in EM - Scanner 1 tests causes instrument abort if ignored CLOSED RDS DOS 8.04 PDF
0324200502 Projected stress voltage in RI-52 tests ignores some infant failures, self heating and degradation effects CLOSED RDS DOS 8.04 PDF
0323200501 Killed RDS Intranet session is still active CLOSED RDS Intranet 1.12 PDF
0303200501 HP 6038 example program returns 0V for all readings on first pass, okay on second TABLED RDS DOS 8.04 PDF
0303200502 F4 key in EMPAC & EMAGE doesn't perform complete instrumentation initialization CLOSED RDS DOS 8.04 PDF
0302200501 SelfCAL denotes correctable values as FAIL even though testing can proceed CLOSED RDS Intranet 1.2 PDF
0302200501 SelfCAL denotes correctable values as FAIL even though testing can proceed CLOSED RDS DOS 8.04 PDF
0301200501 Maintenance and Calibration instrumentation aborts not displaying procedure that caused the abort CLOSED RDS Intranet 1.2 PDF
0301200501 Maintenance and Calibration instrumentation aborts not displaying procedure that caused the abort CLOSED RDS DOS 8.04 PDF
0228200501 Peak beta displayed during EMPAC or Build test debugging doesn't match end result CLOSED RDS Intranet 1.2 PDF
0228200501 Peak beta displayed during EMPAC or Build test debugging doesn't match end result CLOSED RDS DOS 8.04 PDF
0228200502 Bulk voltage (PS3_Voltage field) set to zero during import CLOSED RDS Intranet 1.12 PDF
0218200501 Gate current limit condition not reported as error in EMPAC Vgs @ Ids test CLOSED RDS DOS 8.04 PDF
0208200501 NTM-S power up clear circuit added to prevent hot switching in RI-52 systems CLOSED NTM B PDF
0204200506 Ran out of disk space on RDS Intranet server CLOSED RDS Intranet 1.30 PDF
0204200507 Current offset of PS's not being measured correctly in SelfCal CLOSED RDS Intranet 1.2 PDF
0204200507 Current offset of PS's not being measured correctly in SelfCal CLOSED RDS DOS 8.04 PDF
0204200508 Maintenance CPM Module test is missing the analog test portion CLOSED RDS DOS 8.04 PDF
0201200501 Unable to kill an RDS Intranet user session CLOSED RDS Intranet 1.12 PDF
0131200501 Trying to set skipped tests results in runtime error "Variable is undefined 'SetupItem'" CLOSED RDS Intranet 1.11 PDF
0128200501 Shorted ISM node relay not detected in I Stress Diag CLOSED RDS DOS 8.04 PDF
0127200501 Release button always enabled after Unset button clicked CLOSED RDS Intranet 1.30 PDF
0127200502 Only last test has complete Examine trend chart data after additional reduced data is appended CLOSED RDS Intranet 1.12.02 PDF
0125200501 Only one user can export or import data at once CLOSED RDS Intranet 1.20.03 PDF
0125200502 Memory map field missing from export of lot data abort records CLOSED RDS Intranet 1.20.03 PDF
0125200506 Unable to delete temporary import tables CLOSED RDS Intranet 1.20.03 PDF
0125200508 Modified time is not being exported or imported CLOSED RDS Intranet 1.20.03 PDF
0125200513 Crystal Reports overwriting text when large names or numbers encountered CLOSED RDS Intranet 1.21 PDF
0125200514 Wafer probe time missing from wafer summary report CLOSED RDS Intranet 1.21 PDF
0125200520 Missing ReportParameters field when exporting/importing reports to/from Excel files CLOSED RDS Intranet 1.20.03 PDF
0125200521 Which probe card used missing from lot data CLOSED RDS Intranet 1.12.01 PDF
0125200521 Which probe card used missing from lot data CLOSED RDS Intranet 1.20.03 PDF
0125200522 Not tying graphs to lot data information during importation CLOSED RDS Intranet 1.20.03 PDF
0125200523 Application reports session killed immediately after login CLOSED RDS Intranet 1.12 PDF
0125200524 RDS Intranet EG 2001 prober driver asks too many questions when loading wafer from stage CLOSED RDS Intranet 1.12.01 PDF
0125200525 Bulk pin is not optional in "Ids - Sweep Vds, Step Vgs & Vbs" CLOSED RDS Intranet 1.31 PDF
0125200536 Unable to delete orphaned tests that are released or that have process limits assigned CLOSED RDS Intranet 1.20.03 PDF
0124200501 Test name list view in TCR wizard doesn't have Clear All button CLOSED RDS Intranet 1.21 PDF
0124200502 Precedence not defined nor automatically handled importing data from another Intranet DB CLOSED RDS Intranet 1.20.03 PDF
0124200504 Can pick device from list view that won't be found during validation CLOSED RDS Intranet 1.31 PDF
0124200509 Temptronic IEEE-488 address hard coded at 5 CLOSED RDS Intranet 1.21 PDF
0124200510 Temperature ramp rate is currently limited to 5Cº/min CLOSED RDS Intranet 1.21 PDF
0124200511 Last wafer unload temperature is fixed at 30ºC CLOSED RDS Intranet 1.21 PDF
0124200512 TCR Wizard aborts with test results fixed at 0.0 CLOSED RDS Intranet 1.21 PDF
0124200513 CSV export does not include wafer temperature, die passed, bad die, etc. CLOSED RDS Intranet 1.20.03 PDF
0124200515 Duplicates not being skipped during test plan import CLOSED RDS Intranet 1.12.02 PDF
0124200516 HTML Report on the Master Test List times out when filtered by latest versions CLOSED RDS Intranet 1.30 PDF
0124200517 Embedded user function messages not displayed in Acquire and did not allow controlled halt in Build CLOSED RDS Intranet 1.31 PDF
0124200518 Error reading XML file prevents starting of RDS Intranet application CLOSED RDS Intranet 1.12 PDF
0124200520 Export-Import does not include numerous fields and records CLOSED RDS Intranet 1.20.03 PDF
0124200521 Browser hangs-up when trying to create Activity report CLOSED RDS Intranet 1.31 PDF
0124200522 Lot names longer than 30 characters cause runtime error when imported into another Intranet DB CLOSED RDS Intranet 1.12 PDF
0123200507 Cannot provide custom instructions to operator when starting an Acquire wafer lot CLOSED RDS Intranet 1.13 PDF
0123200513 Examine windows stay open after logging out of RDS Intranet CLOSED RDS Intranet 1.12 PDF
0818200801 Rmax set to value for 3T test not using FS check CLOSED RDS Intranet 1.30 PDF
0123200519 Unable to view schematics from test list editor CLOSED RDS Intranet 1.31 PDF
0123200526 User's list view doesn't display permissions and other expected fields CLOSED RDS Intranet 1.31 PDF
0123200533 Cannot view self calibration results in simulation mode CLOSED RDS Intranet 1.31 PDF
0123200539 None of the lot reports uses Critical Test field CLOSED RDS Intranet 1.21 PDF
0123200540 Cannot delete records that were used to perform automated testing OPEN RDS Intranet 2.00 PDF
0121200503 PS2 is not connected for Voltage Measurement tests CLOSED RDS DOS 8.04 PDF
0120200501 Increase current to 300mA for one RI-52 experiment CLOSED RDS DOS 8.04 PDF
0119200501 Test fixtures called out by incorrect P/Ns during HP meter calibration CLOSED RDS DOS 8.04 PDF
0119200502 Bogus data points appear when making scale changes in EMAGE CLOSED RDS DOS 8.04 PDF
0119200504 TDDB Multiple test fails to start or requires repeated attempts due to initial stress setup error CLOSED RDS DOS 8.04 PDF
0119200505 RDS Intranet prober checkout displays "retriving SRQ" CLOSED RDS Intranet 1.12 PDF
0119200506 VSM fails maintenance program VSM_ILIM.EXE for output leakage after jumpers are cut CLOSED RDS DOS 8.04 PDF
0118200502 Jramp has 216 General protection fault on controller if device high and low shorted together CLOSED RDS Intranet 1.12 PDF
0118200503 Incorrect message displayed with TEL P8 driver: "Press PROG then 4 to profile the wafer" CLOSED RDS Intranet 1.12 PDF
0118200504 EMPAC schematic displays all unused pins grounded for non-PAM tests when "PAM Only" option is selected CLOSED RDS DOS 8.04 PDF
0118200505 First resistance always returned at 3 seconds for WLR Isothermal CLOSED RDS Intranet 1.2 PDF
0118200505 First resistance always returned at 3 seconds for WLR Isothermal CLOSED RDS DOS 8.04 PDF
0118200506 Instrumentation status shows incorrect HISMU connections after switching modes CLOSED RDS Intranet 1.2 PDF
0118200506 Instrumentation status shows incorrect HISMU connections after switching modes CLOSED RDS DOS 8.04 PDF
0114200501 Powering down between downrange does not allow enough settling time for correct measurement CLOSED RDS Intranet 1.2 PDF
0114200501 Powering down between downrange does not allow enough settling time for correct measurement CLOSED RDS DOS 8.04 PDF
0114200502 CPM Tests in Main Diagnostics cannot be disabled using example INI file CLOSED RDS DOS 8.04 PDF
0114200503 Running CMMDIAG Without First Creating CMMSTD.INI Results in Comparison to Default Values CLOSED RDS DOS 8.04 PDF
0114200504 DMM calibration routine aborts to DOS at step 5 for offscale readings CLOSED RDS DOS 8.04 PDF
1202200401 Runtime error at line 221 occurs when starting next wafer if total test time for previous wafers exceeds 8.3 hours CLOSED RDS Intranet 1.11.02 PDF
1119200401 A modest increase in test time (5ms per test) is seen with RDS DOS 8.x in Acquire CLOSED RDS DOS 8.04 PDF
1118200401 Unable to edit limits after creating new version of test. States record is locked when it isn't. CLOSED RDS Intranet 1.11.02 PDF
0805200401 Improve 1500V testing to support multiple high pins & reduce chance of DMM damage CLOSED RDS Intranet 1.2 PDF
0805200401 Improve 1500V testing to support multiple high pins & reduce chance of DMM damage CLOSED RDS DOS 8.04 PDF
0628200401 PAM module Maintenance test fails in system with several PAMs CLOSED RDS DOS 8.04 PDF
0610200401 HP4278A driver not working on 500MHz or faster PC's CLOSED RDS Intranet 1.2 PDF
0610200401 HP4278A driver not working on 500MHz or faster PC's CLOSED RDS DOS 8.04 PDF
0604200402 Stress Voltage Diagnostics is ignoring large negative voltage errors CLOSED RDS DOS 8.04 PDF
0604200403 PAM module Maintenance test tries to use wrong pins in RI-53 CLOSED RDS DOS 8.04 PDF
0604200404 Instrumentation settings not cleared when leaving Maintenance or Calibration applications CLOSED RDS DOS 8.04 PDF
0604200405 UFM relay passes with or without test fixture CLOSED RDS DOS 8.04 PDF
0108200401 PS module test not checking limit bit in negative polarity CLOSED RDS DOS 8.04 PDF
0106200401 PAM module test not working properly in systems with both CPMs and PAMs CLOSED RDS DOS 8.04 PDF
1218200301 Add correction constants to CMM for better capacitance measurements CLOSED RDS Intranet 1.30 PDF
1218200301 Add correction constants to CMM for better capacitance measurements CLOSED RDS DOS 8.11 PDF
1218200302 Number format of Self Cal offset limits doesn't match that of measured value CLOSED RDS Intranet 1.2 PDF
1218200302 Number format of Self Cal offset limits doesn't match that of measured value CLOSED RDS DOS 8.04 PDF
1218200304 EMAGE test validation incorrect for HP capacitance meters CLOSED RDS DOS 8.04 PDF
1218200305 EMPAC test options (F8) help missing description of power down cell (now Rng pwr off) CLOSED RDS DOS 8.04 PDF
1212200301 Incorporate the standalone CMM relay test routine into CMM diagnostics and improve its user interface CLOSED RDS DOS 8.04 PDF
1212200302 Incorrect minimum values on the help line (tooltip) for the Jramp & Vramp constant stress level field CLOSED RDS Intranet 1.2 PDF
1212200302 Incorrect minimum values on the help line (tooltip) for the Jramp & Vramp constant stress level field CLOSED RDS DOS 8.04 PDF
1119200301 Vgs search fails to converge for valid device CLOSED RDS Intranet 1.2 PDF
1119200301 Vgs search fails to converge for valid device CLOSED RDS DOS 8.04 PDF
1119200302 Cannot calibrate or run PS module test on ISM when it is installed in function backplane CLOSED RDS DOS 8.04 PDF
1110200301 RDS DOS install crashes when custom code selected CLOSED RDS DOS 8.04 PDF
1105200301 EMPAC F8 screen errors with user functions: UF #9 cannot be saved and fixrange cannot be set CLOSED RDS DOS 8.04 PDF
1105200302 CMM not fix ranged during calibration CLOSED RDS DOS 8.04 PDF
1017200301 Vramp resolution compromised by high leakage fail level CANCELLED RDS DOS 8.04 PDF
1016200301 Measurements made with frequency counter returning 1.0E+20 CLOSED RDS Intranet 1.2 PDF
1016200301 Measurements made with frequency counter returning 1.0E+20 CLOSED RDS DOS 8.04 PDF
0915200301 General protection fault occurs when starting program or using ChargeScope options CLOSED RDS Intranet 1.2 PDF
0915200301 General protection fault occurs when starting program or using ChargeScope options CLOSED RDS DOS 8.04 PDF
0910200301 V@I test not returning clamp voltage or reporting unknown error code CLOSED RDS DOS 8.02 PDF
0819200301 Instrumentation driver routine FindDACRange does not detect invalid range codes CLOSED RDS Intranet 1.2 PDF
0819200301 Instrumentation driver routine FindDACRange does not detect invalid range codes CLOSED RDS DOS 8.04 PDF
0808200302 Make Main Diagnostics comparision limits specification based CLOSED RDS Intranet 1.2 PDF
0808200302 Make Main Diagnostics comparision limits specification based CLOSED RDS DOS 8.04 PDF
0725200303 Autorange not forced in Ids, Sweep Vgs, Step Vbs test and possibly others CLOSED RDS Intranet 1.12 PDF
0725200303 Autorange not forced in Ids, Sweep Vgs, Step Vbs test and possibly others CLOSED RDS DOS 8.04 PDF
0725200304 Incorrect Vgs At Ids error message for VFIF-16 CLOSED RDS Intranet 1.2 PDF
0725200304 Incorrect Vgs At Ids error message for VFIF-16 CLOSED RDS DOS 8.04 PDF
0723200301 Main Diagnostics DMM Common Mode Volts Test does not flag PS1 in current limit CLOSED RDS Intranet 1.2 PDF
0723200301 Main Diagnostics DMM Common Mode Volts Test does not flag PS1 in current limit CLOSED RDS DOS 8.04 PDF
0528200304 DMM range is too high for the best resolution when measuring in diagnostic CPM station connect test CLOSED RDS Intranet 1.2 PDF
0528200304 DMM range is too high for the best resolution when measuring in diagnostic CPM station connect test CLOSED RDS DOS 8.04 PDF
0425200302 Meaurement errors using NVM Vt test when looking for smaller target currents CLOSED RDS Intranet 1.2 PDF
0425200302 Meaurement errors using NVM Vt test when looking for smaller target currents CLOSED RDS DOS 8.04 PDF
0210200302 PS2 current limit not flagged for Voltage Pulsing w/PPG Module Test CLOSED RDS Intranet 1.00 PDF
0210200302 PS2 current limit not flagged for Voltage Pulsing w/PPG Module Test CLOSED RDS DOS 8.04 PDF
0118200305 Instrumentation abort occurs when calibrating a VF, VFIF, or VFIF-16 CLOSED RDS DOS 8.04 PDF
0118200306 Cannot open file TDDB01.PIN in EMREL TDDB multiple experiment CLOSED RDS DOS 8.04 PDF
0118200310 Syntax error messages unclear in Hookup dialog command mode CLOSED RDS Intranet 1.2 PDF
0118200310 Syntax error messages unclear in Hookup dialog command mode CLOSED RDS DOS 8.04 PDF
0907200202 Expand DMM low relay testing to include testing for shorts and testing the DMM high relay CLOSED RDS Intranet 1.2 PDF
0907200202 Expand DMM low relay testing to include testing for shorts and testing the DMM high relay CLOSED RDS DOS 8.04 PDF
0731200202 Runtime error 216 exiting MS-DOS shell CLOSED RDS DOS 8.04 PDF
0111200203 Kanji characters appear where spaces and numbers should be when running RDS DOS under Windows CLOSED RDS DOS 1.0 PDF
0111200204 EG4085 prober driver prompts twice for profiling and aligning wafer. CLOSED RDS Intranet 1.00 PDF
0111200204 EG4085 prober driver prompts twice for profiling and aligning wafer. CLOSED RDS DOS 8.04 PDF
0111200207 Remove TSM/TSR support from system software to free up address space for other modules CLOSED RDS DOS 8.04 PDF
1106200101 Have finding DMM voltage offsets not use matrix pins and occur more often than system initialization CLOSED RDS Intranet 1.2 PDF
1106200101 Have finding DMM voltage offsets not use matrix pins and occur more often than system initialization CLOSED RDS DOS 8.04 PDF
0914200102 Status display not showing all matrix pins CLOSED RDS Intranet 1.2 PDF
0914200102 Status display not showing all matrix pins CLOSED RDS DOS 8.04 PDF
0821200102 Load board table names not saved in GEM files OPEN RDS Intranet 2.00 PDF
0821200102 Load board table names not saved in GEM files OPEN RDS DOS 2.r PDF
0821200102 Load board table names not saved in GEM files OPEN RDS DOS 8.x PDF
0816200102 All of the IEEE-448 read functions in Reedholm library require character terminator of just EOI CLOSED RDS Intranet 1.21 PDF
0816200102 All of the IEEE-448 read functions in Reedholm library require character terminator of just EOI CLOSED RDS DOS 8.1 PDF
0514200101 Restoring security key settings results in replacement key # being 48 instead of 0 CLOSED RDS DOS 8.04 PDF
0313200101 DMM module digital test always shows Byte 0, Bit 7 stuck low with the DMM-12 CLOSED RDS DOS 8.04 PDF
0504200004 Input error message is not properly cleared in Scal CLOSED RDS DOS 8.04 PDF
0504200006 Prior test selections result in improper current measurement in HISMU module test. CLOSED RDS DOS 8.04 PDF
0302200001 Add ability in Acquire for operator to pick lots to probe from user supplied list CLOSED RDS DOS 1.12.02 PDF
0117200004 Timing issues with VRAMP and JRAMP CLOSED RDS Intranet 1.2 PDF
0117200004 Timing issues with VRAMP and JRAMP CLOSED RDS DOS 8.04 PDF
0117200006 Status not cleared when exiting main diagnostics from instrumentation abort CLOSED RDS DOS 8.04 PDF
1210199912 Timing test always uses 60Hz, even if on 50Hz power. CLOSED RDS DOS 8.04 PDF
1209199912 Errors when trying to exit several of the Maintenance Module tests early CLOSED RDS DOS 8.04 PDF
1209199918 EG prober hangs up when controller is rebooted CLOSED RDS Intranet 1.2 PDF
1209199918 EG prober hangs up when controller is rebooted CLOSED RDS DOS 8.04 PDF
0621199901 Critical timing checks need to have limits established. CLOSED RDS DOS 8.04 PDF
0512199802 VFIFs loose control of output voltage if current below 0.2% of range CLOSED RDS Intranet 1.2 PDF
0512199802 VFIFs loose control of output voltage if current below 0.2% of range CLOSED RDS DOS 8.04 PDF
0214199704 Cannot specify target value with limits CLOSED RDS Intranet 1.12.02 PDF
0113199505 2T resistance measurement errors when forcing current. CLOSED RDS Intranet 1.2 PDF
0113199505 2T resistance measurement errors when forcing current. CLOSED RDS DOS 8.04 PDF
0112199306 Add support of measure voltage, sweep current test CLOSED RDS Intranet 1.32 PDF
0325199204 Allow previous test result to be force condition of present test CLOSED RDS Intranet 1.2 PDF